An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
نویسندگان
چکیده
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent test interface is designed to perform testing in the normal mode and to cope with nested interrupts in a realtime manner. The circular scan test interface facilitates the processes of both test pattern generation and signature analysis. By tolerating redundant read/write/shzft operations, we develop a new march algorithm called TRSMarch t o achieve the goals of low hardware overhead, short test time, and high fault coverage. Index Words: Memory Test, Serial Interfacing technique, h n s p a r e n t Test, Interrupt
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